Learning-Based On-Line Testing in Feedforward Neural Networks

I
IOLTW
2002
Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02)
Abstract - Learning-Based On-Line Testing in Feedforward Neural Networks

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Naotake Kamiura Articles by Kazuharu Yamato Articles by Teijiro Isokawa Articles by Nobuyuki Matsui

Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02)

Isle of Bendor, France

July 08-July 10

ISBN: 0-7695-1641-6

	ASCII Text	x
	Naotake Kamiura, Kazuharu Yamato, Teijiro Isokawa, Nobuyuki Matsui, "Learning-Based On-Line Testing in Feedforward Neural Networks," On-Line Testing Workshop, IEEE International, pp. 180, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002.

	BibTex	x
	@article{ 10.1109/OLT.2002.1030206, author = {Naotake Kamiura and Kazuharu Yamato and Teijiro Isokawa and Nobuyuki Matsui}, title = {Learning-Based On-Line Testing in Feedforward Neural Networks}, journal ={On-Line Testing Workshop, IEEE International}, volume = {0}, year = {2002}, isbn = {0-7695-1641-6}, pages = {180}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030206}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Workshop, IEEE International TI - Learning-Based On-Line Testing in Feedforward Neural Networks SN - 0-7695-1641-6 SP EP A1 - Naotake Kamiura, A1 - Kazuharu Yamato, A1 - Teijiro Isokawa, A1 - Nobuyuki Matsui, PY - 2002 KW - null VL - 0 JA - On-Line Testing Workshop, IEEE International ER -

Naotake Kamiura, Himeji Institute of Technology

Kazuharu Yamato, Hyogo University

Teijiro Isokawa, Himeji Institute of Technology

Nobuyuki Matsui, Himeji Institute of Technology

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030206

Learning-based on-line testing in feedforward neural networks (NNs) is discussed. After the convergence of the ordinary learning, the re-learning employing two sigmoid activation functions per neuron in the last layer of the NN is made. It sets up the range of erroneous potentials produced from the last layer, and enables us to detect faults without extra hardware.

Citation:

Naotake Kamiura, Kazuharu Yamato, Teijiro Isokawa, Nobuyuki Matsui, "Learning-Based On-Line Testing in Feedforward Neural Networks," ioltw, pp.180, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.