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Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02)
Stop & Go BIST
Isle of Bendor, France
July 08-July 10
ISBN: 0-7695-1641-6
ASCII Text
x 
 
Ilia Polian, Bernd Becker, "Stop & Go BIST," On-Line Testing Workshop, IEEE International, pp. 147, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002.
 
 
BibTex
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@article{ 10.1109/OLT.2002.1030198,
author = {Ilia Polian and Bernd Becker},
title = {Stop & Go BIST},
journal ={On-Line Testing Workshop, IEEE International},
volume = {0},
year = {2002},
isbn = {0-7695-1641-6},
pages = {147},
doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030198},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - On-Line Testing Workshop, IEEE International
TI - Stop & Go BIST
SN - 0-7695-1641-6
SP
EP
A1 - Ilia Polian,
A1 - Bernd Becker,
PY - 2002
KW - BIST
KW - Thermal constraints
KW - Delay testing
KW - IP cores
VL - 0
JA - On-Line Testing Workshop, IEEE International
ER -
 
Ilia Polian, Albert-Ludwigs-University
Bernd Becker, Albert-Ludwigs-University
A BIST method enabling two-pattern testing at-speed without violating thermal constraints by introducing cool down periods is proposed. The application of the method is demonstrated based on a scalable BIST architecture. Applicability on IP cores is given since only a two-pattern test set is required as input.
Index Terms:
BIST, Thermal constraints, Delay testing, IP cores
Citation:
Ilia Polian, Bernd Becker, "Stop & Go BIST," ioltw, pp.147, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002
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