Seventh International On-Line Testing Workshop CMOS Differential and Absolute Thermal Sensors Taormina, Italy July 09-July 11 ISBN: 0-7695-1290-9
Abstract: This paper treats the test of CMOS digital ICs by using the thermal mapping of the silicon surface as a test observable. Two different temperature-sensing strategies are presented. The novel sensors developed are an on-chip CMOS Differential Temperature (DT) sensor and a Proportional to Absolute Temperature (PTAT) sensor. The sensors are small, robust, effective, and operate without affecting the circuit performance. The sensors have been implemented in a standard .18 ?m CMOS technology.
Citation:
Ashish Syal, Victor Lee, André Ivanov, Josep Altet, "CMOS Differential and Absolute Thermal Sensors," ioltw, pp.0127, Seventh International On-Line Testing Workshop, 2001 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||