A New Laser System for X-Rays Flashes Sensitivity Evaluation

I
IOLTW
2001
Seventh International On-Line Testing Workshop
Abstract - A New Laser System for X-Rays Flashes Sensitivity Evaluation

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	Similar Articles Articles by D. Lewis Articles by H. Lapuyade Articles by Y. Deval Articles by Y. Maidon Articles by F. Darracq Articles by R. Briand Articles by P. Fouillat

Seventh International On-Line Testing Workshop

Taormina, Italy

July 09-July 11

ISBN: 0-7695-1290-9

	ASCII Text	x
	D. Lewis, H. Lapuyade, Y. Deval, Y. Maidon, F. Darracq, R. Briand, P. Fouillat, "A New Laser System for X-Rays Flashes Sensitivity Evaluation," On-Line Testing Workshop, IEEE International, pp. 0111, Seventh International On-Line Testing Workshop, 2001.

	BibTex	x
	@article{ 10.1109/OLT.2001.937829, author = {D. Lewis and H. Lapuyade and Y. Deval and Y. Maidon and F. Darracq and R. Briand and P. Fouillat}, title = {A New Laser System for X-Rays Flashes Sensitivity Evaluation}, journal ={On-Line Testing Workshop, IEEE International}, volume = {0}, year = {2001}, isbn = {0-7695-1290-9}, pages = {0111}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2001.937829}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Workshop, IEEE International TI - A New Laser System for X-Rays Flashes Sensitivity Evaluation SN - 0-7695-1290-9 SP EP A1 - D. Lewis, A1 - H. Lapuyade, A1 - Y. Deval, A1 - Y. Maidon, A1 - F. Darracq, A1 - R. Briand, A1 - P. Fouillat, PY - 2001 VL - 0 JA - On-Line Testing Workshop, IEEE International ER -

D. Lewis, Universit? Bordeaux 1

H. Lapuyade, Universit? Bordeaux 1

Y. Deval, Universit? Bordeaux 1

Y. Maidon, Universit? Bordeaux 1

F. Darracq, Universit? Bordeaux 1

R. Briand, Universit? Bordeaux 1

P. Fouillat, Universit? Bordeaux 1

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/OLT.2001.937829

Abstract: This paper describes a new methodology using an optical laser bench for ICs X-rays-flashes sensitivity evaluation. Application to the study of one hardening technique of a BandGap Reference circuit is presented.

Citation:

D. Lewis, H. Lapuyade, Y. Deval, Y. Maidon, F. Darracq, R. Briand, P. Fouillat, "A New Laser System for X-Rays Flashes Sensitivity Evaluation," ioltw, pp.0111, Seventh International On-Line Testing Workshop, 2001

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