Improving Fault Coverage in System Tests

I
IOLTW
2000
6th IEEE International On-Line Testing Workshop (IOLTW)
Abstract - Improving Fault Coverage in System Tests

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6th IEEE International On-Line Testing Workshop (IOLTW)

Palma de Mallorca, Spain

July 03-July 05

ISBN: 0-7695-0646-1

	ASCII Text	x
	Janusz Sosnowski, "Improving Fault Coverage in System Tests," On-Line Testing Workshop, IEEE International, pp. 207, 6th IEEE International On-Line Testing Workshop (IOLTW), 2000.

	BibTex	x
	@article{ 10.1109/OLT.2000.856638, author = {Janusz Sosnowski}, title = {Improving Fault Coverage in System Tests}, journal ={On-Line Testing Workshop, IEEE International}, volume = {0}, year = {2000}, isbn = {0-7695-0646-1}, pages = {207}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2000.856638}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Workshop, IEEE International TI - Improving Fault Coverage in System Tests SN - 0-7695-0646-1 SP EP A1 - Janusz Sosnowski, PY - 2000 KW - In system testing KW - test controllability and observability KW - fault coverage analysis KW - on-line monitoring VL - 0 JA - On-Line Testing Workshop, IEEE International ER -

Janusz Sosnowski, Warsaw University of Technology

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/OLT.2000.856638

The paper is devoted to the problem of self-testing in system environment (field diagnosis and maintenance at the end user). It discusses test process decomposition in the context of increasing hardware complexity and proliferation of embedded DFT and BIST circuitry in the commercial off the shelve VLSI chips (COTS). Test observability is improved with the use of various on-line monitoring mechanisms. To optimize test effectiveness we use special tools based on direct and indirect fault coverage analysis.

Index Terms:

In system testing, test controllability and observability, fault coverage analysis, on-line monitoring

Citation:

Janusz Sosnowski, "Improving Fault Coverage in System Tests," ioltw, pp.207, 6th IEEE International On-Line Testing Workshop (IOLTW), 2000

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