A Pseudo-Deterministic Functional ATPG based on EFSM Traversing

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Sixth International Workshop on Microprocessor Test and Verification (MTV'05)

Austin, Texas

November 03-November 05

ISBN: 0-7695-2627-6

	ASCII Text	x
	G. Di Guglielmo, F. Fummi, C. Marconcini, G. Pravadelli, "A Pseudo-Deterministic Functional ATPG based on EFSM Traversing," Microprocessor Test and Verification, International Workshop on, pp. 70-75, Sixth International Workshop on Microprocessor Test and Verification (MTV'05), 2005.

	BibTex	x
	@article{ 10.1109/MTV.2005.1, author = {G. Di Guglielmo and F. Fummi and C. Marconcini and G. Pravadelli}, title = {A Pseudo-Deterministic Functional ATPG based on EFSM Traversing}, journal ={Microprocessor Test and Verification, International Workshop on}, volume = {0}, year = {2005}, issn = {1550-4093}, pages = {70-75}, doi = {http://doi.ieeecomputersociety.org/10.1109/MTV.2005.1}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Microprocessor Test and Verification, International Workshop on TI - A Pseudo-Deterministic Functional ATPG based on EFSM Traversing SN - 1550-4093 SP70 EP75 A1 - G. Di Guglielmo, A1 - F. Fummi, A1 - C. Marconcini, A1 - G. Pravadelli, PY - 2005 KW - null VL - 0 JA - Microprocessor Test and Verification, International Workshop on ER -

G. Di Guglielmo, Universita di Verona, Italy

F. Fummi, Universita di Verona, Italy

C. Marconcini, Universita di Verona, Italy

G. Pravadelli, Universita di Verona, Italy

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MTV.2005.1

This paper presents a functional ATPG framework which exploits the extended finite state machine (EFSM) model to pseudodeterministically generate test sequences. A constraint solver or a SAT-solver is used to generate test vectors that allow us to uniformly traverse the state space of the design under test (DUT). This definitely increases the ability of the ATPG to observe and control hard-to-detect faults.

Citation:

G. Di Guglielmo, F. Fummi, C. Marconcini, G. Pravadelli, "A Pseudo-Deterministic Functional ATPG based on EFSM Traversing," mtv, pp.70-75, Sixth International Workshop on Microprocessor Test and Verification (MTV'05), 2005

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