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Fifth International Workshop on Microprocessor Test and Verification (MTV'04)
Debugging Sequential Circuits Using Boolean Satisfiability
Austin, Texas
September 09-September 10
ISBN: 0-7695-2320-X
Moayad Fahim Ali, University of Toronto
Andreas Veneris, University of Toronto
Sean Safarpour, University of Toronto
Magdy Abadir, Freescale Semiconductor, Inc.
Rolf Drechsler, University of Bremen
Alexander Smith, University of Toronto
Logic debugging of today?s complex sequential circuits is an important problem. In this paper, a logic debugging methodology for multiple errors in sequential circuits with no state equivalence is developed. The proposed approach reduces the problem of debugging to an instance of Boolean Satisfiability. This formulation takes advantage of modern Boolean Satisfiability solvers that handle large circuits in a computationally efficient manner. An extensive suite of experiments with large sequential circuits confirm the robustness and efficiency of the proposed approach. The results further suggest that Boolean Satisfiability provides an effective platform for sequential logic debugging.
Citation:
Moayad Fahim Ali, Andreas Veneris, Sean Safarpour, Magdy Abadir, Rolf Drechsler, Alexander Smith, "Debugging Sequential Circuits Using Boolean Satisfiability," mtv, pp.44-49, Fifth International Workshop on Microprocessor Test and Verification (MTV'04), 2004
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