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Fifth International Workshop on Microprocessor Test and Verification (MTV'04)
Automatic Test Programs Generation Driven by Internal Performance Counters
Austin, Texas
September 09-September 10
ISBN: 0-7695-2320-X
W. Lindsay, Intel® Corporation
E. Sanchez, Politecnico di Torino
M. Sonza Reorda, Politecnico di Torino
G. Squillero, Politecnico di Torino
In the past performance counters have been available to top-end microprocessors as hardware luxuries for profiling critical applications. Today, on the contrary, several desktop microprocessors contain hardware support for monitoring performance events. This paper proposes a new approach to automatic test program generation that exploits such hardware to monitor specific micro-architectural events. In the approach, the generation tool repeatedly evaluates and improves candidate programs directly running on the target microprocessor: candidate programs are not "simulated", but rather "executed". The fast evaluation of candidate tests enables the use of an automatic methodology even on large designs. As a case study, an experiment targeting the Intel? Pentium? 4 microprocessor is reported.
Citation:
W. Lindsay, E. Sanchez, M. Sonza Reorda, G. Squillero, "Automatic Test Programs Generation Driven by Internal Performance Counters," mtv, pp.8-13, Fifth International Workshop on Microprocessor Test and Verification (MTV'04), 2004
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