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Records of the 2004 International Workshop on Memory Technology, Design and Testing (MTDT'04)
An Integrated Memory Self Test and EDA Solution
San Jose, California, USA
August 09-August 10
ISBN: 0-7695-2193-2
ASCII Text
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R. Dean Adams, Robert Abbott, Xiaoliang Bai, Dwayne Burek, Eric MacDonald, "An Integrated Memory Self Test and EDA Solution," Memory Technology, Design and Testin, IEEE International Workshop on, pp. 92-95, Records of the 2004 International Workshop on Memory Technology, Design and Testing (MTDT'04), 2004.
 
 
BibTex
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@article{ 10.1109/MTDT.2004.5,
author = {R. Dean Adams and Robert Abbott and Xiaoliang Bai and Dwayne Burek and Eric MacDonald},
title = {An Integrated Memory Self Test and EDA Solution},
journal ={Memory Technology, Design and Testin, IEEE International Workshop on},
volume = {0},
year = {2004},
issn = {1087-4852},
pages = {92-95},
doi = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2004.5},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Memory Technology, Design and Testin, IEEE International Workshop on
TI - An Integrated Memory Self Test and EDA Solution
SN - 1087-4852
SP92
EP95
A1 - R. Dean Adams,
A1 - Robert Abbott,
A1 - Xiaoliang Bai,
A1 - Dwayne Burek,
A1 - Eric MacDonald,
PY - 2004
VL - 0
JA - Memory Technology, Design and Testin, IEEE International Workshop on
ER -
 
R. Dean Adams, Magma Design Automation
Robert Abbott, Magma Design Automation
Xiaoliang Bai, Magma Design Automation
Dwayne Burek, Magma Design Automation
Eric MacDonald, University of Texas at El Paso
Memory built-in self-test (BIST) is a critical portion of the chip design and electronic design automation (EDA) flow. A BIST tool needs to understand the memory at the topological and layout levels in order to test for the correct fault models. The BIST also needs to be fully integrated into the overall EDA flow in order to have the least impact on chip area and have the greatest ease of use to the chip designer.
Citation:
R. Dean Adams, Robert Abbott, Xiaoliang Bai, Dwayne Burek, Eric MacDonald, "An Integrated Memory Self Test and EDA Solution," mtdt, pp.92-95, Records of the 2004 International Workshop on Memory Technology, Design and Testing (MTDT'04), 2004
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