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Records of the 2004 International Workshop on Memory Technology, Design and Testing (MTDT'04)
Redundancy & It?s Not Just for Defects Anymore
San Jose, California, USA
August 09-August 10
ISBN: 0-7695-2193-2
ASCII Text
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Rob Aitken, "Redundancy & It?s Not Just for Defects Anymore," Memory Technology, Design and Testin, IEEE International Workshop on, pp. 117-120, Records of the 2004 International Workshop on Memory Technology, Design and Testing (MTDT'04), 2004.
 
 
BibTex
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@article{ 10.1109/MTDT.2004.19,
author = {Rob Aitken},
title = {Redundancy & It?s Not Just for Defects Anymore},
journal ={Memory Technology, Design and Testin, IEEE International Workshop on},
volume = {0},
year = {2004},
issn = {1087-4852},
pages = {117-120},
doi = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2004.19},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Memory Technology, Design and Testin, IEEE International Workshop on
TI - Redundancy & It?s Not Just for Defects Anymore
SN - 1087-4852
SP117
EP120
A1 - Rob Aitken,
PY - 2004
KW - null
VL - 0
JA - Memory Technology, Design and Testin, IEEE International Workshop on
ER -
 
Rob Aitken, Artisan Components
This paper shows how process variation affects memory margin and performance, and shows that in some cases additional redundancy capability can be used to recover yield due to process variation in addition to yield recovery for defects.
Citation:
Rob Aitken, "Redundancy & It?s Not Just for Defects Anymore," mtdt, pp.117-120, Records of the 2004 International Workshop on Memory Technology, Design and Testing (MTDT'04), 2004
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