2003 International Workshop on Memory Technology, Design and Testing (MTDT'03) A Multilevel DRAM with Hierarchical Bitlines and Serial Sensing San Jose, California July 28-July 29 ISBN: 0-7695-2004-9
We propose a multilevel DRAM (MLDRAM) with serial sensing that has lower area overhead than designs that use single-step, flash conversion sensing. The new design exploits hierarchical, multidivided bitlines to offset the reduction in noise margins caused by multilevel signaling and thereby better preserve the signal-to-noise ratio. The multiple sensing operations required to recover multilevel data are performed serially to re-use sense amplifiers and hence minimize the area overhead of the peripheral circuitry at the cost of increased total read time. In a variation of the proposed design, a subset of the addressed row of cells is read in one sensing step while the remaining cells are recovered later in further sensing steps.
Citation:
Bruce F. Cockburn, Jes?s Hern?ndez Tapia, Duncan G. Elliott, "A Multilevel DRAM with Hierarchical Bitlines and Serial Sensing," mtdt, pp.14, 2003 International Workshop on Memory Technology, Design and Testing (MTDT'03), 2003 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||