March SS: A Test for All Static Simple RAM Faults

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Said Hamdioui Articles by Ad J. van de Goor Articles by Mike Rodgers

The 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002)

Isle of Bendor, France

July 10-July 12

ISBN: 0-7695-1617-3

	ASCII Text	x
	Said Hamdioui, Ad J. van de Goor, Mike Rodgers, "March SS: A Test for All Static Simple RAM Faults," Memory Technology, Design and Testin, IEEE International Workshop on, pp. 95, The 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002), 2002.

	BibTex	x
	@article{ 10.1109/MTDT.2002.1029769, author = {Said Hamdioui and Ad J. van de Goor and Mike Rodgers}, title = {March SS: A Test for All Static Simple RAM Faults}, journal ={Memory Technology, Design and Testin, IEEE International Workshop on}, volume = {0}, year = {2002}, issn = {1087-4852}, pages = {95}, doi = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2002.1029769}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Memory Technology, Design and Testin, IEEE International Workshop on TI - March SS: A Test for All Static Simple RAM Faults SN - 1087-4852 SP EP A1 - Said Hamdioui, A1 - Ad J. van de Goor, A1 - Mike Rodgers, PY - 2002 KW - Memory testing KW - fault models KW - simple/linked faults KW - march test KW - fault coverage VL - 0 JA - Memory Technology, Design and Testin, IEEE International Workshop on ER -

Said Hamdioui, Intel Corporation and Delft University of Technology

Ad J. van de Goor, Delft University of Technology

Mike Rodgers, Intel Corporation

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MTDT.2002.1029769

This paper presents all simple (i.e., not linked) static fault models that have been shown to exist for Random Access Memories (RAMs), and shows that none of the current industrial march tests has the capability to detect all these faults. It therefore introduces a new test (March SS), with a test length of 22n, that detects all realistic simple static faults in RAMs.

Index Terms:

Memory testing, fault models, simple/linked faults, march test, fault coverage

Citation:

Said Hamdioui, Ad J. van de Goor, Mike Rodgers, "March SS: A Test for All Static Simple RAM Faults," mtdt, pp.95, The 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002), 2002

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.