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Improving After-the-Fact Tracing and Mapping: Supporting Software Quality Predictions
November/December 2005 (vol. 22 no. 6)
pp. 30-37
ASCII Text
x 
 
Jane Huffman Hayes, Alex Dekhtyar, Senthil Karthekeyan Sundaram, "Improving After-the-Fact Tracing and Mapping: Supporting Software Quality Predictions," IEEE Software, vol. 22, no. 6, pp. 30-37, November/December, 2005.
 
 
BibTex
x
 
@article{ 10.1109/MS.2005.156,
author = {Jane Huffman Hayes and Alex Dekhtyar and Senthil Karthekeyan Sundaram},
title = {Improving After-the-Fact Tracing and Mapping: Supporting Software Quality Predictions},
journal ={IEEE Software},
volume = {22},
number = {6},
issn = {0740-7459},
year = {2005},
pages = {30-37},
doi = {http://doi.ieeecomputersociety.org/10.1109/MS.2005.156},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Software
TI - Improving After-the-Fact Tracing and Mapping: Supporting Software Quality Predictions
IS - 6
SN - 0740-7459
SP30
EP37
EPD - 30-37
A1 - Jane Huffman Hayes,
A1 - Alex Dekhtyar,
A1 - Senthil Karthekeyan Sundaram,
PY - 2005
KW - Requirements tracing
KW - traceability
KW - information retrieval
KW - relevance feedback
KW - mapping
VL - 22
JA - IEEE Software
ER -
 
Jane Huffman Hayes, University of Kentucky
Alex Dekhtyar, University of Kentucky
Senthil Karthekeyan Sundaram, University of Kentucky
The requirements traceability matrix has proven successful as a way to predict quality before code is written. However, its tedious development process, which requires that analysts manually discover and vet links between artifact levels has stymied its widespread adoption. Our tracing toolkit, called RETRO (Requirements Tracing on Target), automates the information retrieval process, making RTM's development easier. Backed by empirical results, we describe RETRO?s advantages over other information retrieval approaches.

This article is part of a special issue on predictor modeling.

Index Terms:
Requirements tracing, traceability, information retrieval, relevance feedback, mapping
Citation:
Jane Huffman Hayes, Alex Dekhtyar, Senthil Karthekeyan Sundaram, "Improving After-the-Fact Tracing and Mapping: Supporting Software Quality Predictions," IEEE Software, vol. 22, no. 6, pp. 30-37, Nov./Dec. 2005, doi:10.1109/MS.2005.156
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