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End-to-End Defect Modeling
September/October 2004 (vol. 21 no. 5)
pp. 98-100
ASCII Text
x 
 
Jean-Jacques Gras, "End-to-End Defect Modeling," IEEE Software, vol. 21, no. 5, pp. 98-100, September/October, 2004.
 
 
BibTex
x
 
@article{ 10.1109/MS.2004.1331312,
author = {Jean-Jacques Gras},
title = {End-to-End Defect Modeling},
journal ={IEEE Software},
volume = {21},
number = {5},
issn = {0740-7459},
year = {2004},
pages = {98-100},
doi = {http://doi.ieeecomputersociety.org/10.1109/MS.2004.1331312},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Software
TI - End-to-End Defect Modeling
IS - 5
SN - 0740-7459
SP98
EP100
EPD - 98-100
A1 - Jean-Jacques Gras,
PY - 2004
KW - cause-effect modeling
VL - 21
JA - IEEE Software
ER -
 
Using cause-effect modeling to drive software quality can move your organization to higher maturity levels.
Index Terms:
cause-effect modeling
Citation:
Jean-Jacques Gras, "End-to-End Defect Modeling," IEEE Software, vol. 21, no. 5, pp. 98-100, Sep./Oct. 2004, doi:10.1109/MS.2004.1331312
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