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Security Refresh: Protecting Phase-Change Memory against Malicious Wear Out
January/February 2011 (vol. 31 no. 1)
pp. 119-127
ASCII Text
x 
 
Nak Hee Seong, Dong Hyuk Woo, Hsien-Hsin S. Lee, "Security Refresh: Protecting Phase-Change Memory against Malicious Wear Out," IEEE Micro, vol. 31, no. 1, pp. 119-127, January/February, 2011.
 
 
BibTex
x
 
@article{ 10.1109/MM.2010.101,
author = {Nak Hee Seong and Dong Hyuk Woo and Hsien-Hsin S. Lee},
title = {Security Refresh: Protecting Phase-Change Memory against Malicious Wear Out},
journal ={IEEE Micro},
volume = {31},
number = {1},
issn = {0272-1732},
year = {2011},
pages = {119-127},
doi = {http://doi.ieeecomputersociety.org/10.1109/MM.2010.101},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Micro
TI - Security Refresh: Protecting Phase-Change Memory against Malicious Wear Out
IS - 1
SN - 0272-1732
SP119
EP127
EPD - 119-127
A1 - Nak Hee Seong,
A1 - Dong Hyuk Woo,
A1 - Hsien-Hsin S. Lee,
PY - 2011
KW - phase change memory
KW - security
KW - wear leveling
KW - dynamic address remapping
VL - 31
JA - IEEE Micro
ER -
 
Nak Hee Seong, Georgia Institute of Technology
Dong Hyuk Woo, Intel Labs
Hsien-Hsin S. Lee, Georgia Institute of Technology

As dynamic RAM scaling approaches its physical limit, phase-change memory is the most mature and well-studied option for potential DRAM replacement. However, malicious wear-out attacks can exploit PCM's limited write endurance. To address this, a low-cost wear-leveling scheme can dynamically randomize the data addresses across the entire address space and obfuscate their actual locations from users and system software.

1. S. Cho and H. Lee, "Flip-N-Write: A Simple Deterministic Technique to Improve PRAM Write Performance, Energy and Endurance," Proc. IEEE/ACM Int'l Symp. Microarchitecture, ACM Press, 2009, pp. 347-357.
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5. N.H. Seong, D.H. Woo, and H.-H.S. Lee, "Security Refresh: Prevent Malicious Wear-Out and Increase Durability for Phase-Change Memory with Dynamically Randomized Address Mapping," Proc. Int'l Symp. Computer Architecture, ACM Press, 2010, pp. 383-394.
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Index Terms:
phase change memory, security, wear leveling, dynamic address remapping
Citation:
Nak Hee Seong, Dong Hyuk Woo, Hsien-Hsin S. Lee, "Security Refresh: Protecting Phase-Change Memory against Malicious Wear Out," IEEE Micro, vol. 31, no. 1, pp. 119-127, Jan.-Feb. 2011, doi:10.1109/MM.2010.101
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