AVIO: Detecting Atomicity Violations via Access-Interleaving Invariants

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January/February 2007 (vol. 27 no. 1)

pp. 26-35

	ASCII Text	x
	Shan Lu, Joseph Tucek, Feng Qin, Yuanyuan Zhou, "AVIO: Detecting Atomicity Violations via Access-Interleaving Invariants," IEEE Micro, vol. 27, no. 1, pp. 26-35, January/February, 2007.

	BibTex	x
	@article{ 10.1109/MM.2007.5, author = {Shan Lu and Joseph Tucek and Feng Qin and Yuanyuan Zhou}, title = {AVIO: Detecting Atomicity Violations via Access-Interleaving Invariants}, journal ={IEEE Micro}, volume = {27}, number = {1}, issn = {0272-1732}, year = {2007}, pages = {26-35}, doi = {http://doi.ieeecomputersociety.org/10.1109/MM.2007.5}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Micro TI - AVIO: Detecting Atomicity Violations via Access-Interleaving Invariants IS - 1 SN - 0272-1732 SP26 EP35 EPD - 26-35 A1 - Shan Lu, A1 - Joseph Tucek, A1 - Feng Qin, A1 - Yuanyuan Zhou, PY - 2007 KW - reliability KW - testing KW - debugging KW - concurrent program KW - atomicity violation KW - concurrency bug KW - bug detection KW - hardware support KW - program invariant VL - 27 JA - IEEE Micro ER -

Shan Lu, University of Illinois at Urbana-Champaign

Joseph Tucek, University of Illinois at Urbana-Champaign

Feng Qin, University of Illinois at Urbana-Champaign

Yuanyuan Zhou, University of Illinois at Urbana-Champaign

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MM.2007.5

This article proposes an innovative concurrent-program invariant that captures programmers' atomicity assumptions. It describes a tool with two implementations, one in software and the other using hardware support, that can automatically extract such invariants and detect atomicity bugs.

Index Terms:

reliability, testing, debugging, concurrent program, atomicity violation, concurrency bug, bug detection, hardware support, program invariant

Citation:

Shan Lu, Joseph Tucek, Feng Qin, Yuanyuan Zhou, "AVIO: Detecting Atomicity Violations via Access-Interleaving Invariants," IEEE Micro, vol. 27, no. 1, pp. 26-35, Jan./Feb. 2007, doi:10.1109/MM.2007.5

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