MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits

Micro
2006
Issue No. 5 - September/October
Abstract - MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits

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	Similar Articles Articles by Kundan Nepal Articles by R. Iris Bahar Articles by Joseph Mundy Articles by William R. Patterson Articles by Alexander Zaslavsky

September/October 2006 (vol. 26 no. 5)

pp. 19-27

	ASCII Text	x
	Kundan Nepal, R. Iris Bahar, Joseph Mundy, William R. Patterson, Alexander Zaslavsky, "MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits," IEEE Micro, vol. 26, no. 5, pp. 19-27, September/October, 2006.

	BibTex	x
	@article{ 10.1109/MM.2006.96, author = {Kundan Nepal and R. Iris Bahar and Joseph Mundy and William R. Patterson and Alexander Zaslavsky}, title = {MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits}, journal ={IEEE Micro}, volume = {26}, number = {5}, issn = {0272-1732}, year = {2006}, pages = {19-27}, doi = {http://doi.ieeecomputersociety.org/10.1109/MM.2006.96}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Micro TI - MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits IS - 5 SN - 0272-1732 SP19 EP27 EPD - 19-27 A1 - Kundan Nepal, A1 - R. Iris Bahar, A1 - Joseph Mundy, A1 - William R. Patterson, A1 - Alexander Zaslavsky, PY - 2006 KW - Reliability KW - Markov random fields KW - probabilistic computing KW - noise immunity KW - redundancy VL - 26 JA - IEEE Micro ER -

Kundan Nepal, Brown University

R. Iris Bahar, Brown University

Joseph Mundy, Brown University

William R. Patterson, Brown University

Alexander Zaslavsky, Brown University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MM.2006.96

Shrinking devices to nanoscale, increasing integration densities, and reducing voltage levels to the thermal limit?all conspire to produce faulty systems. A possible solution is a fault-tolerant probabilistic framework based on Markov random fields. This article introduces a new redundancy element, the MRF reinforcer, which achieves significant immunity to single-event upsets and noise.

Index Terms:

Reliability, Markov random fields, probabilistic computing, noise immunity, redundancy

Citation:

Kundan Nepal, R. Iris Bahar, Joseph Mundy, William R. Patterson, Alexander Zaslavsky, "MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits," IEEE Micro, vol. 26, no. 5, pp. 19-27, Sep./Oct. 2006, doi:10.1109/MM.2006.96

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