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Impact of Parameter Variations on Circuits and Microarchitecture
November/December 2006 (vol. 26 no. 6)
pp. 30-39
ASCII Text
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Osman S. Unsal, James W. Tschanz, Keith Bowman, Vivek De, Xavier Vera, Antonio González, Oguz Ergin, "Impact of Parameter Variations on Circuits and Microarchitecture," IEEE Micro, vol. 26, no. 6, pp. 30-39, November/December, 2006.
 
 
BibTex
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@article{ 10.1109/MM.2006.122,
author = {Osman S. Unsal and James W. Tschanz and Keith Bowman and Vivek De and Xavier Vera and Antonio González and Oguz Ergin},
title = {Impact of Parameter Variations on Circuits and Microarchitecture},
journal ={IEEE Micro},
volume = {26},
number = {6},
issn = {0272-1732},
year = {2006},
pages = {30-39},
doi = {http://doi.ieeecomputersociety.org/10.1109/MM.2006.122},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Micro
TI - Impact of Parameter Variations on Circuits and Microarchitecture
IS - 6
SN - 0272-1732
SP30
EP39
EPD - 30-39
A1 - Osman S. Unsal,
A1 - James W. Tschanz,
A1 - Keith Bowman,
A1 - Vivek De,
A1 - Xavier Vera,
A1 - Antonio González,
A1 - Oguz Ergin,
PY - 2006
KW - variation-tolerant design
KW - processor architectures
KW - performance and reliability
KW - impact of VLSI on system design
VL - 26
JA - IEEE Micro
ER -
 
Osman S. Unsal, Barcelona Supercomputing Center
James W. Tschanz, Circuits Research Lab, Intel Microprocessor Technology Labs
Keith Bowman, Circuits Research Lab, Intel Microprocessor Technology Labs
Vivek De, Circuits Research Lab, Intel Microprocessor Technology Labs
Xavier Vera, Intel Barcelona Research Center
Antonio González, Universitat Politècnica de Catalunya & Intel Barcelona Research Center
Oguz Ergin, TOBB University of Economics and Technology, Ankara
Parameter variations, which are increasing along with advances in process technologies, affect both timing and power. Variability must be considered at both the circuit and microarchitectural design levels to keep pace with performance scaling and to keep power consumption within reasonable limits. This article presents an overview of the main sources of variability and surveys variation-tolerant circuit and microarchitectural approaches.
Index Terms:
variation-tolerant design, processor architectures, performance and reliability, impact of VLSI on system design
Citation:
Osman S. Unsal, James W. Tschanz, Keith Bowman, Vivek De, Xavier Vera, Antonio González, Oguz Ergin, "Impact of Parameter Variations on Circuits and Microarchitecture," IEEE Micro, vol. 26, no. 6, pp. 30-39, Nov./Dec. 2006, doi:10.1109/MM.2006.122
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