Energy Awareness and Uncertainty in Microarchitecture-Level Design

Micro
2005
Issue No. 5 - September/October
Abstract - Energy Awareness and Uncertainty in Microarchitecture-Level Design

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	Similar Articles Articles by Diana Marculescu Articles by Emil Talpes

September/October 2005 (vol. 25 no. 5)

pp. 64-76

	ASCII Text	x
	Diana Marculescu, Emil Talpes, "Energy Awareness and Uncertainty in Microarchitecture-Level Design," IEEE Micro, vol. 25, no. 5, pp. 64-76, September/October, 2005.

	BibTex	x
	@article{ 10.1109/MM.2005.86, author = {Diana Marculescu and Emil Talpes}, title = {Energy Awareness and Uncertainty in Microarchitecture-Level Design}, journal ={IEEE Micro}, volume = {25}, number = {5}, issn = {0272-1732}, year = {2005}, pages = {64-76}, doi = {http://doi.ieeecomputersociety.org/10.1109/MM.2005.86}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Micro TI - Energy Awareness and Uncertainty in Microarchitecture-Level Design IS - 5 SN - 0272-1732 SP64 EP76 EPD - 64-76 A1 - Diana Marculescu, A1 - Emil Talpes, PY - 2005 KW - Energy awareness KW - gate length KW - on-chip temperature variations KW - variability metric VL - 25 JA - IEEE Micro ER -

Diana Marculescu, Carnegie Mellon University

Emil Talpes, Carnegie Mellon University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MM.2005.86

The authors present microarchitecture-level statistical models for characterizing process and system parameter variability, concentrating on gate length and on-chip temperature variations. To assess the effect of microarchitecture decisions on these variations, and vice versa, they propose a joint performance, power, and variability metric that distinguishes among various design choices.

Index Terms:

Energy awareness, gate length, on-chip temperature variations, variability metric

Citation:

Diana Marculescu, Emil Talpes, "Energy Awareness and Uncertainty in Microarchitecture-Level Design," IEEE Micro, vol. 25, no. 5, pp. 64-76, Sep./Oct. 2005, doi:10.1109/MM.2005.86

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