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Lifetime Reliability: Toward an Architectural Solution
May/June 2005 (vol. 25 no. 3)
pp. 70-80
ASCII Text
x 
 
Jayanth Srinivasan, Sarita V. Adve, Pradip Bose, Jude A. Rivers, "Lifetime Reliability: Toward an Architectural Solution," IEEE Micro, vol. 25, no. 3, pp. 70-80, May/June, 2005.
 
 
BibTex
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@article{ 10.1109/MM.2005.54,
author = {Jayanth Srinivasan and Sarita V. Adve and Pradip Bose and Jude A. Rivers},
title = {Lifetime Reliability: Toward an Architectural Solution},
journal ={IEEE Micro},
volume = {25},
number = {3},
issn = {0272-1732},
year = {2005},
pages = {70-80},
doi = {http://doi.ieeecomputersociety.org/10.1109/MM.2005.54},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Micro
TI - Lifetime Reliability: Toward an Architectural Solution
IS - 3
SN - 0272-1732
SP70
EP80
EPD - 70-80
A1 - Jayanth Srinivasan,
A1 - Sarita V. Adve,
A1 - Pradip Bose,
A1 - Jude A. Rivers,
PY - 2005
KW - Lifetime reliability
KW - scaling
KW - power management
KW - RAMP
KW - MTTF
KW - DRM
VL - 25
JA - IEEE Micro
ER -
 
Jayanth Srinivasan, University of Illinois, Urbana-Champaign
As scaling threatens to erode reliability standards, lifetime reliability must become a first-class design constraint. Microarchitectural intervention offers a novel way to manage lifetime reliability without significantly sacrificing cost and performance.
Index Terms:
Lifetime reliability, scaling, power management, RAMP, MTTF, DRM
Citation:
Jayanth Srinivasan, Sarita V. Adve, Pradip Bose, Jude A. Rivers, "Lifetime Reliability: Toward an Architectural Solution," IEEE Micro, vol. 25, no. 3, pp. 70-80, May/June 2005, doi:10.1109/MM.2005.54
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