Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation

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November/December 2005 (vol. 25 no. 6)

pp. 10-16

	ASCII Text	x
	Shekhar Borkar, "Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation," IEEE Micro, vol. 25, no. 6, pp. 10-16, November/December, 2005.

	BibTex	x
	@article{ 10.1109/MM.2005.110, author = {Shekhar Borkar}, title = {Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation}, journal ={IEEE Micro}, volume = {25}, number = {6}, issn = {0272-1732}, year = {2005}, pages = {10-16}, doi = {http://doi.ieeecomputersociety.org/10.1109/MM.2005.110}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Micro TI - Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation IS - 6 SN - 0272-1732 SP10 EP16 EPD - 10-16 A1 - Shekhar Borkar, PY - 2005 KW - Hardware Computer System Organization VL - 25 JA - IEEE Micro ER -

Shekhar Borkar, Intel Corp.

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MM.2005.110

As technology scales, variability will continue to become worse. Random dopantfluctuations and sub-wavelength lithography will yield static variations, supply voltageand temperature variations will affect circuit performance and leakage power, soft-errorrates will continue to rise, and transistor aging will become worse. We discuss theseeffects and propose solutions to build reliable systems with billions of unreliablecomponents.

Index Terms:

Hardware Computer System Organization

Citation:

Shekhar Borkar, "Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation," IEEE Micro, vol. 25, no. 6, pp. 10-16, Nov./Dec. 2005, doi:10.1109/MM.2005.110

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