Measuring Architectural Vulnerability Factors

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	Similar Articles Articles by Shubhendu S. Mukherjee Articles by Christopher T. Weaver Articles by Joel Emer Articles by Steven K. Reinhardt Articles by Todd Austin

November/December 2003 (vol. 23 no. 6)

pp. 70-75

	ASCII Text	x
	Shubhendu S. Mukherjee, Christopher T. Weaver, Joel Emer, Steven K. Reinhardt, Todd Austin, "Measuring Architectural Vulnerability Factors," IEEE Micro, vol. 23, no. 6, pp. 70-75, November/December, 2003.

	BibTex	x
	@article{ 10.1109/MM.2003.1261389, author = {Shubhendu S. Mukherjee and Christopher T. Weaver and Joel Emer and Steven K. Reinhardt and Todd Austin}, title = {Measuring Architectural Vulnerability Factors}, journal ={IEEE Micro}, volume = {23}, number = {6}, issn = {0272-1732}, year = {2003}, pages = {70-75}, doi = {http://doi.ieeecomputersociety.org/10.1109/MM.2003.1261389}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Micro TI - Measuring Architectural Vulnerability Factors IS - 6 SN - 0272-1732 SP70 EP75 EPD - 70-75 A1 - Shubhendu S. Mukherjee, A1 - Christopher T. Weaver, A1 - Joel Emer, A1 - Steven K. Reinhardt, A1 - Todd Austin, PY - 2003 VL - 23 JA - IEEE Micro ER -

Shubhendu S. Mukherjee, Intel

Christopher T. Weaver, Intel, University of Michigan

Joel Emer, Intel

Steven K. Reinhardt, Intel, University of Michigan

Todd Austin, University of Michigan

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MM.2003.1261389

Processor designers need accurate estimates of soft-error rates early in the design cycle to make appropriate cost-reliability tradeoffs. Here, the authors present a method for estimating the architectural vulnerability factor—the probability that a fault in a particular structure will result in an error.

Citation:

Shubhendu S. Mukherjee, Christopher T. Weaver, Joel Emer, Steven K. Reinhardt, Todd Austin, "Measuring Architectural Vulnerability Factors," IEEE Micro, vol. 23, no. 6, pp. 70-75, Nov./Dec. 2003, doi:10.1109/MM.2003.1261389

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