10 A Four-Terabit Packet Switch Supporting Long Round-Trip Times

Micro
2003
Issue No. 1 - January/February
Abstract - 10 A Four-Terabit Packet Switch Supporting Long Round-Trip Times

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January/February 2003 (vol. 23 no. 1)

pp. 10-24

	ASCII Text	x
	François Abel, Cyriel Minkenberg, Ronald P. Luijten, Mitchell Gusat, Ilias Iliadis, "10 A Four-Terabit Packet Switch Supporting Long Round-Trip Times," IEEE Micro, vol. 23, no. 1, pp. 10-24, January/February, 2003.

	BibTex	x
	@article{ 10.1109/MM.2003.1179894, author = {François Abel and Cyriel Minkenberg and Ronald P. Luijten and Mitchell Gusat and Ilias Iliadis}, title = {10 A Four-Terabit Packet Switch Supporting Long Round-Trip Times}, journal ={IEEE Micro}, volume = {23}, number = {1}, issn = {0272-1732}, year = {2003}, pages = {10-24}, doi = {http://doi.ieeecomputersociety.org/10.1109/MM.2003.1179894}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Micro TI - 10 A Four-Terabit Packet Switch Supporting Long Round-Trip Times IS - 1 SN - 0272-1732 SP10 EP24 EPD - 10-24 A1 - François Abel, A1 - Cyriel Minkenberg, A1 - Ronald P. Luijten, A1 - Mitchell Gusat, A1 - Ilias Iliadis, PY - 2003 VL - 23 JA - IEEE Micro ER -

François Abel, IBM Research, Zurich Research Laboratory

Cyriel Minkenberg, IBM Research, Zurich Research Laboratory

Ronald P. Luijten, IBM Research, Zurich Research Laboratory

Mitchell Gusat, IBM Research, Zurich Research Laboratory

Ilias Iliadis, IBM Research, Zurich Research Laboratory

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MM.2003.1179894

This 4-Tbps packet switch uses a combined input- and crosspoint-queued (CICQ) structure with virtual output queuing at the ingress to achieve the scalability of input-buffered switches, the performance of output-buffered switches, and low latency.

Citation:

François Abel, Cyriel Minkenberg, Ronald P. Luijten, Mitchell Gusat, Ilias Iliadis, "10 A Four-Terabit Packet Switch Supporting Long Round-Trip Times," IEEE Micro, vol. 23, no. 1, pp. 10-24, Jan./Feb. 2003, doi:10.1109/MM.2003.1179894

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