Efficient Construction of Aliasing-Free Compaction Circuitry September/October 2002 (vol. 22 no. 5) pp. 82-92
Parallel testing of cores can reduce soc test times, but the finite number of chip I/Os limits such parallelism. Space and time compaction can maximize parallelism by minimizing the required test bandwidth at the core outputs.
Citation:
Ozgur Sinanoglu, Alex Orailoglu, "Efficient Construction of Aliasing-Free Compaction Circuitry," IEEE Micro, vol. 22, no. 5, pp. 82-92, Sep./Oct. 2002, doi:10.1109/MM.2002.1044302 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||