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11th IEEE International Software Metrics Symposium (METRICS'05)
Como, Italy
September 19-September 22
ISBN: 0-7695-2371-4
ASCII Text
x 
 
"Additional Reviewers," Software Metrics, IEEE International Symposium on, pp. xii, 11th IEEE International Software Metrics Symposium (METRICS'05), 2005.
 
 
BibTex
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@article{ 10.1109/METRICS.2005.7,
author = {},
title = {Additional Reviewers},
journal ={Software Metrics, IEEE International Symposium on},
volume = {0},
year = {2005},
issn = {1530-1435},
pages = {xii},
doi = {http://doi.ieeecomputersociety.org/10.1109/METRICS.2005.7},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Software Metrics, IEEE International Symposium on
TI - Additional Reviewers
SN - 1530-1435
SP
EP
PY - 2005
KW - null
VL - 0
JA - Software Metrics, IEEE International Symposium on
ER -
 
Citation:
"Additional Reviewers," metrics, pp.xii, 11th IEEE International Software Metrics Symposium (METRICS'05), 2005
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