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11th IEEE International Software Metrics Symposium (METRICS'05)
Towards Reusable Measurement Patterns
Como, Italy
September 19-September 22
ISBN: 0-7695-2371-4
ASCII Text
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Mikael Lindvall, Paolo Donzelli, Sima Asgari, Vic Basili, "Towards Reusable Measurement Patterns," Software Metrics, IEEE International Symposium on, pp. 21, 11th IEEE International Software Metrics Symposium (METRICS'05), 2005.
 
 
BibTex
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@article{ 10.1109/METRICS.2005.49,
author = {Mikael Lindvall and Paolo Donzelli and Sima Asgari and Vic Basili},
title = {Towards Reusable Measurement Patterns},
journal ={Software Metrics, IEEE International Symposium on},
volume = {0},
year = {2005},
issn = {1530-1435},
pages = {21},
doi = {http://doi.ieeecomputersociety.org/10.1109/METRICS.2005.49},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Software Metrics, IEEE International Symposium on
TI - Towards Reusable Measurement Patterns
SN - 1530-1435
SP
EP
A1 - Mikael Lindvall,
A1 - Paolo Donzelli,
A1 - Sima Asgari,
A1 - Vic Basili,
PY - 2005
KW - null
VL - 0
JA - Software Metrics, IEEE International Symposium on
ER -
 
Mikael Lindvall, Fraunhofer Center for Experimental Software Engineering
Paolo Donzelli, University of Maryland at College Park
Sima Asgari, University of Maryland at College Park
Vic Basili, University of Maryland at College Park and Fraunhofer Center for Experimental Software Engineering
Software measurement programs can help organizations make better decisions regarding their software projects. However, creating and establishing software measurement programs can be both costly and difficult. This paper addresses the problem by focusing on reusability of metrics for software measurement programs through the identification of measurement patterns. We illustrate our work with identifying measurement patterns by providing an extensive and detailed measurement example that is broken down into interdependent building blocks and activities.
Citation:
Mikael Lindvall, Paolo Donzelli, Sima Asgari, Vic Basili, "Towards Reusable Measurement Patterns," metrics, pp.21, 11th IEEE International Software Metrics Symposium (METRICS'05), 2005
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