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Eighth IEEE International Symposium on Software Metrics (METRICS'02)
An Empirical Study of the Impact of Count Models Predictions on Module-Order Models
Ottawa, Canada
June 04-June 07
ISBN: 0-7695-1339-5
Taghi M. Khoshgoftaar, Florida Atlantic University
Erik Geleyn, Florida Atlantic University
Kehan Gao, Florida Atlantic University

Software quality prediction models are used to achieve high software reliability. Prediction models that estimate a quality factor for software modules can be used in directing corrective efforts. Precise quantitative prediction values for the quality factor is often not suffcient. Instead, predicting the rank-order of modules with respect to the quality factor may be more beneficial to the development team. A module-order model (MOM) uses an underlying quantitative prediction model to predict this rank-order.

This paper compares performances of module-order models of two different count models which are used as the underlying prediction models. They are the Poisson regression model (PRM) and the zero-inflated Poisson (ZIP) regression model. It is demonstrated that improving a count model for prediction does not ensure a better MOM performance. A case study of a full-scale industrial software system is used to compare performances of module-order models of the two count models. It was observe dthat improving prediction of the Poisson count model by using zero-inflated Poisson regression did not yield module-order models with better performance. Thus, it was concluded that the degree of prediction accuracy of the underlying model did not influence the results of the subsequent module-order model. Module-order modeling is proven to be a robust and effective method even though both underlying prediction may sometimes lack acceptable prediction accuracy.

Index Terms:
Software reliability, software metrics, module-order modeling, count models, Poisson, ZIP
Citation:
Taghi M. Khoshgoftaar, Erik Geleyn, Kehan Gao, "An Empirical Study of the Impact of Count Models Predictions on Module-Order Models," metrics, pp.161, Eighth IEEE International Symposium on Software Metrics (METRICS'02), 2002
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