Compact variability modeling to the rescue

Design&Test
2010
Issue No. 2 - March/April
Abstract - Compact variability modeling to the rescue

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Compact variability modeling to the rescue (HTML)

March/April 2010 (vol. 27 no. 2)

pp. 4

	ASCII Text	x
	"Compact variability modeling to the rescue," IEEE Design and Test of Computers, vol. 27, no. 2, pp. 4, March/April, 2010.

	BibTex	x
	@article{ 10.1109/MDT.2010.40, author = {}, title = {Compact variability modeling to the rescue}, journal ={IEEE Design and Test of Computers}, volume = {27}, number = {2}, issn = {0740-7475}, year = {2010}, pages = {4}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2010.40}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Compact variability modeling to the rescue IS - 2 SN - 0740-7475 SP EP EPD - 4 PY - 2010 KW - CMOS technology KW - design and test KW - compact variability modeling KW - nanometer CMOS technology VL - 27 JA - IEEE Design and Test of Computers ER -

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2010.40

This issue of D&T includes five special-issue theme articles on compact variability modeling for nanometer CMOS technology. A sixth, nontheme article surveys the effects and ongoing research of power supply noise.

Index Terms:

CMOS technology, design and test, compact variability modeling, nanometer CMOS technology

Citation:

"Compact variability modeling to the rescue," IEEE Design and Test of Computers, vol. 27, no. 2, pp. 4, Mar./Apr. 2010, doi:10.1109/MDT.2010.40

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