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Overcoming Early-Life Failure and Aging for Robust Systems
November/December 2009 (vol. 26 no. 6)
pp. 28-39
Editor's note:
The prospect of system failure has increased because of device- and chip-level effects in the late CMOS era, such as early-life failure and NBTI. In this article, the authors present novel system-level architecture and design innovations to cope with these lifetime reliability challenges.
—Pradip Bose, IBM Research
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Index Terms:
design and test, failure prediction, online self-test and diagnostics, reliability, robust-system design, self-healing
Citation:
Yanjing Li, Young Moon Kim, Evelyn Mintarno, Donald S. Gardner, Subhasish Mitra, "Overcoming Early-Life Failure and Aging for Robust Systems," IEEE Design and Test of Computers, vol. 26, no. 6, pp. 28-39, Nov./Dec. 2009, doi:10.1109/MDT.2009.152
