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March-April 2008 (vol. 25 no. 2)
pp. 198-199
ASCII Text
x 
 
Bruce C. Kim, "TTTC Newsletter," IEEE Design and Test of Computers, vol. 25, no. 2, pp. 198-199, March-April, 2008.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2008.54,
author = {Bruce C. Kim},
title = {TTTC Newsletter},
journal ={IEEE Design and Test of Computers},
volume = {25},
number = {2},
issn = {0740-7475},
year = {2008},
pages = {198-199},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2008.54},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - TTTC Newsletter
IS - 2
SN - 0740-7475
SP198
EP199
EPD - 198-199
A1 - Bruce C. Kim,
PY - 2008
KW - TTTC
KW - test technology
KW - ETS
KW - IMS3TW
KW - IOLTS
VL - 25
JA - IEEE Design and Test of Computers
ER -
 
This newsletter provides information on past and upcoming events related to the IEEE Computer Society's Test Technology Technical Council and the test community.
Index Terms:
TTTC, test technology, ETS, IMS3TW, IOLTS
Citation:
Bruce C. Kim, "TTTC Newsletter," IEEE Design and Test of Computers, vol. 25, no. 2, pp. 198-199, Mar. 2008, doi:10.1109/MDT.2008.54
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