The commonality of vector generation techniques

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March-April 2008 (vol. 25 no. 2)

pp. 200

	ASCII Text	x
	Scott Davidson, "The commonality of vector generation techniques," IEEE Design and Test of Computers, vol. 25, no. 2, pp. 200, March-April, 2008.

	BibTex	x
	@article{ 10.1109/MDT.2008.53, author = {Scott Davidson}, title = {The commonality of vector generation techniques}, journal ={IEEE Design and Test of Computers}, volume = {25}, number = {2}, issn = {0740-7475}, year = {2008}, pages = {200}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2008.53}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - The commonality of vector generation techniques IS - 2 SN - 0740-7475 SP EP EPD - 200 A1 - Scott Davidson, PY - 2008 KW - vector generation KW - test compression KW - full scan KW - ATPG KW - logic BIST KW - output compression KW - non-fault-directed test KW - semi-fault-directed test VL - 25 JA - IEEE Design and Test of Computers ER -

Scott Davidson, Sun Microsystems

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2008.53

The value of test compression is that it has allowed us to move along a continuum between the extremes of ATPG and logic BIST, and has enabled us to find the right combination of test size, test coverage, and test time for a given situation. The basic similarity among different DFT techniques should make us feel confident that we are on the right track in our drive for efficient test compression.

Index Terms:

vector generation, test compression, full scan, ATPG, logic BIST, output compression, non-fault-directed test, semi-fault-directed test

Citation:

Scott Davidson, "The commonality of vector generation techniques," IEEE Design and Test of Computers, vol. 25, no. 2, pp. 200, Mar. 2008, doi:10.1109/MDT.2008.53

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