loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
March-April 2008 (vol. 25 no. 2)
pp. 187
ASCII Text
x 
 
Joe Damore, "DATC Newsletter," IEEE Design and Test of Computers, vol. 25, no. 2, pp. 187, March-April, 2008.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2008.33,
author = {Joe Damore},
title = {DATC Newsletter},
journal ={IEEE Design and Test of Computers},
volume = {25},
number = {2},
issn = {0740-7475},
year = {2008},
pages = {187},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2008.33},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - DATC Newsletter
IS - 2
SN - 0740-7475
SP
EP
EPD - 187
A1 - Joe Damore,
PY - 2008
KW - DATC
KW - design automation
KW - IEEE chip design certification initiative
KW - Electronic Design Processes subcommittee workshop
KW - SBCCI
VL - 25
JA - IEEE Design and Test of Computers
ER -
 
This newsletter provides news, events, and information related to the IEEE Computer Society's Design Automation Technical Committee and the EDA community.
Index Terms:
DATC, design automation, IEEE chip design certification initiative, Electronic Design Processes subcommittee workshop, SBCCI
Citation:
Joe Damore, "DATC Newsletter," IEEE Design and Test of Computers, vol. 25, no. 2, pp. 187, Mar. 2008, doi:10.1109/MDT.2008.33
Usage of this product signifies your acceptance of the Terms of Use.