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The case for power with test
May-June 2007 (vol. 24 no. 3)
pp. 296
ASCII Text
x 
 
T.M. Mak, "The case for power with test," IEEE Design and Test of Computers, vol. 24, no. 3, pp. 296, May-June, 2007.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2007.87,
author = {T.M. Mak},
title = {The case for power with test},
journal ={IEEE Design and Test of Computers},
volume = {24},
number = {3},
issn = {0740-7475},
year = {2007},
pages = {296},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2007.87},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - The case for power with test
IS - 3
SN - 0740-7475
SP
EP
EPD - 296
A1 - T.M. Mak,
PY - 2007
KW - power
KW - test
KW - scan shifting
KW - functional and scan shift speed
KW - static and dynamic power
VL - 24
JA - IEEE Design and Test of Computers
ER -
 
T.M. Mak, Intel
In the past few years, many researchers have claimed that power issues in test applications are primarily due to scan shifting. The author of this column explains why this conclusion is simply not realistic.
Index Terms:
power, test, scan shifting, functional and scan shift speed, static and dynamic power
Citation:
T.M. Mak, "The case for power with test," IEEE Design and Test of Computers, vol. 24, no. 3, pp. 296, July 2007, doi:10.1109/MDT.2007.87
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