Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs

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Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs (HTML)

May-June 2007 (vol. 24 no. 3)

pp. 214-215

	ASCII Text	x
	Mohammad Tehranipoor, Kenneth M. Butler, "Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs," IEEE Design and Test of Computers, vol. 24, no. 3, pp. 214-215, May-June, 2007.

	BibTex	x
	@article{ 10.1109/MDT.2007.72, author = {Mohammad Tehranipoor and Kenneth M. Butler}, title = {Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs}, journal ={IEEE Design and Test of Computers}, volume = {24}, number = {3}, issn = {0740-7475}, year = {2007}, pages = {214-215}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2007.72}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs IS - 3 SN - 0740-7475 SP214 EP215 EPD - 214-215 A1 - Mohammad Tehranipoor, A1 - Kenneth M. Butler, PY - 2007 KW - IR drop KW - power supply noise KW - PSN KW - deep-submicron designs VL - 24 JA - IEEE Design and Test of Computers ER -

Mohammad Tehranipoor, University of Connecticut

Kenneth M. Butler, Texas Instruments

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2007.72

As technology scales to 22 nm and functional density continues to rise, many factors and parameters have a direct impact on the design and test of chips. Among such challenges, IR-drop and power supply noise (PSN) effects have become more significant in recent years. This special issue addresses some of the key issues in this area, focusing on the impact of PSN on design and test of very deep-submicron designs, and highlighting the importance of PSN and IR drop to design and test engineers in the semiconductor industry and academic researchers.

Index Terms:

IR drop, power supply noise, PSN, deep-submicron designs

Citation:

Mohammad Tehranipoor, Kenneth M. Butler, "Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs," IEEE Design and Test of Computers, vol. 24, no. 3, pp. 214-215, July 2007, doi:10.1109/MDT.2007.72

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