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March-April 2007 (vol. 24 no. 2)
pp. 197
ASCII Text
x 
 
Bruce C. Kim, "Test Technology TC Newsletter," IEEE Design and Test of Computers, vol. 24, no. 2, pp. 197, March-April, 2007.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2007.58,
author = {Bruce C. Kim},
title = {Test Technology TC Newsletter},
journal ={IEEE Design and Test of Computers},
volume = {24},
number = {2},
issn = {0740-7475},
year = {2007},
pages = {197},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2007.58},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Test Technology TC Newsletter
IS - 2
SN - 0740-7475
SP
EP
EPD - 197
A1 - Bruce C. Kim,
PY - 2007
KW - TTTC
KW - test technology
KW - SWTW 07
KW - IMSTW 07
KW - GTW 07
VL - 24
JA - IEEE Design and Test of Computers
ER -
 
This newsletter provides information on past and upcoming events related to the IEEE Computer Society's Test Technology Technical Council and the test community.
Index Terms:
TTTC, test technology, SWTW 07, IMSTW 07, GTW 07
Citation:
Bruce C. Kim, "Test Technology TC Newsletter," IEEE Design and Test of Computers, vol. 24, no. 2, pp. 197, June 2007, doi:10.1109/MDT.2007.58
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