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September-October 2007 (vol. 24 no. 5)
pp. 511
ASCII Text
x 
 
Bruce C. Kim, "TTTC Newsletter," IEEE Design and Test of Computers, vol. 24, no. 5, pp. 511, September-October, 2007.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2007.176,
author = {Bruce C. Kim},
title = {TTTC Newsletter},
journal ={IEEE Design and Test of Computers},
volume = {24},
number = {5},
issn = {0740-7475},
year = {2007},
pages = {511},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2007.176},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - TTTC Newsletter
IS - 5
SN - 0740-7475
SP
EP
EPD - 511
A1 - Bruce C. Kim,
PY - 2007
KW - TTTC
KW - test technology
KW - Semiconductor Wafer Test Workshop
KW - SWTW
KW - ITC
KW - MTV
KW - HLDVT
VL - 24
JA - IEEE Design and Test of Computers
ER -
 
This newsletter provides information on past and upcoming events related to the IEEE Computer Society's Test Technology Technical Council and the test community.
Index Terms:
TTTC, test technology, Semiconductor Wafer Test Workshop, SWTW, ITC, MTV, HLDVT
Citation:
Bruce C. Kim, "TTTC Newsletter," IEEE Design and Test of Computers, vol. 24, no. 5, pp. 511, Sept. 2007, doi:10.1109/MDT.2007.176
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