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DAC Highlights
September-October 2007 (vol. 24 no. 5)
pp. 502-504
ASCII Text
x 
 
Sachin Sapatnekar, Leon Stok, "DAC Highlights," IEEE Design and Test of Computers, vol. 24, no. 5, pp. 502-504, September-October, 2007.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2007.160,
author = {Sachin Sapatnekar and Leon Stok},
title = {DAC Highlights},
journal ={IEEE Design and Test of Computers},
volume = {24},
number = {5},
issn = {0740-7475},
year = {2007},
pages = {502-504},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2007.160},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - DAC Highlights
IS - 5
SN - 0740-7475
SP502
EP504
EPD - 502-504
A1 - Sachin Sapatnekar,
A1 - Leon Stok,
PY - 2007
KW - Design Automation Conference
KW - DAC
KW - electronic design automation
KW - automotive electronics
KW - semiconductor industry
VL - 24
JA - IEEE Design and Test of Computers
ER -
 
Sachin Sapatnekar, University of Minnesota
Leon Stok, IBM
The 44th Design Automation Conference (DAC) was held on 4-8 June 2007 in San Diego, California, and brought together design engineers, managers, developers, and researchers from industry and academia. This report provides a short summary of the technical trends in this premier event on electronic design automation and silicon solutions.
Index Terms:
Design Automation Conference, DAC, electronic design automation, automotive electronics, semiconductor industry
Citation:
Sachin Sapatnekar, Leon Stok, "DAC Highlights," IEEE Design and Test of Computers, vol. 24, no. 5, pp. 502-504, Sept. 2007, doi:10.1109/MDT.2007.160
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