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July/August 2007 (vol. 24 no. 4)
pp. 407
ASCII Text
x 
 
Bruce C. Kim, "TTTC Newsletter," IEEE Design and Test of Computers, vol. 24, no. 4, pp. 407, July/August, 2007.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2007.147,
author = {Bruce C. Kim},
title = {TTTC Newsletter},
journal ={IEEE Design and Test of Computers},
volume = {24},
number = {4},
issn = {0740-7475},
year = {2007},
pages = {407},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2007.147},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - TTTC Newsletter
IS - 4
SN - 0740-7475
SP
EP
EPD - 407
A1 - Bruce C. Kim,
PY - 2007
KW - TTTC
KW - test technology
KW - EWDTS
KW - DFT
KW - ATS
KW - ITC
VL - 24
JA - IEEE Design and Test of Computers
ER -
 
This newsletter provides information on past and upcoming events related to the IEEE Computer Society's Test Technology Technical Council and the test community.
Index Terms:
TTTC, test technology, EWDTS, DFT, ATS, ITC
Citation:
Bruce C. Kim, "TTTC Newsletter," IEEE Design and Test of Computers, vol. 24, no. 4, pp. 407, July/Aug. 2007, doi:10.1109/MDT.2007.147
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