Conflicting International Standards Pressure Chip Designers

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January-February 2007 (vol. 24 no. 1)

pp. 98-99

	ASCII Text	x
	Victor Berman, "Conflicting International Standards Pressure Chip Designers," IEEE Design and Test of Computers, vol. 24, no. 1, pp. 98-99, January-February, 2007.

	BibTex	x
	@article{ 10.1109/MDT.2007.10, author = {Victor Berman}, title = {Conflicting International Standards Pressure Chip Designers}, journal ={IEEE Design and Test of Computers}, volume = {24}, number = {1}, issn = {0740-7475}, year = {2007}, pages = {98-99}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2007.10}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Conflicting International Standards Pressure Chip Designers IS - 1 SN - 0740-7475 SP98 EP99 EPD - 98-99 A1 - Victor Berman, PY - 2007 KW - standards KW - communications KW - chip designers KW - China VL - 24 JA - IEEE Design and Test of Computers ER -

Victor Berman, Cadence Design Systems

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2007.10

There is a growing controversy on the international stage between established communications standards from the US and the European Union (EU) and those being developed by emerging economic giants in Southeast Asia, particularly China. Find out more, in this column.

Index Terms:

standards, communications, chip designers, China

Citation:

Victor Berman, "Conflicting International Standards Pressure Chip Designers," IEEE Design and Test of Computers, vol. 24, no. 1, pp. 98-99, Jan. 2007, doi:10.1109/MDT.2007.10

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