January/February 2006 (vol. 23 no. 1) pp. 71
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.8
The 36th annual IEEE International Test Conference convened from 8 to 10 November 2005 in Austin, Texas. The location was a significant move for ITC: It was the first time the conference had met west of the Mississippi, as ITC's general chair Rob Aitken pointed out during his introduction at the plenary session. The conference theme, "Test: Survival of the Fittest," called to mind the test industry's rapidly evolving and increasingly competitive nature, especially of recent years.
Index Terms:
ITC 2005, International Test Conference, low-cost ATE, very-deep submicron tecnology, yield ramping
Citation:
Ken Butler, "Conference Reports: 2005 International Test Conference," IEEE Design and Test of Computers, vol. 23, no. 1, pp. 71, Jan./Feb. 2006, doi:10.1109/MDT.2006.8 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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