loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
May/June 2006 (vol. 23 no. 3)
pp. 182-184
ASCII Text
x 
 
Sachin Sapatnekar, Grant Martin, "DAC Highlights," IEEE Design and Test of Computers, vol. 23, no. 3, pp. 182-184, May/June, 2006.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2006.66,
author = {Sachin Sapatnekar and Grant Martin},
title = {DAC Highlights},
journal ={IEEE Design and Test of Computers},
volume = {23},
number = {3},
issn = {0740-7475},
year = {2006},
pages = {182-184},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.66},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - DAC Highlights
IS - 3
SN - 0740-7475
SP182
EP184
EPD - 182-184
A1 - Sachin Sapatnekar,
A1 - Grant Martin,
PY - 2006
KW - Design Automation Conference
KW - DAC
VL - 23
JA - IEEE Design and Test of Computers
ER -
 
Sachin Sapatnekar, University of Minnesota
Grant Martin, Tensilica
The 43rd Design Automation Conference presents leading-edge industry practices and academic research across IC, embedded-systems, and "beyond the die" design technologies and methodologies. The authors discuss the highlights, from keynote talks by reknowned personalities in the semiconductor industry to hands-on tutorials.
Index Terms:
Design Automation Conference, DAC
Citation:
Sachin Sapatnekar, Grant Martin, "DAC Highlights," IEEE Design and Test of Computers, vol. 23, no. 3, pp. 182-184, May/June 2006, doi:10.1109/MDT.2006.66
Usage of this product signifies your acceptance of the Terms of Use.