2006 Latin American Test Workshop

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2006 Latin American Test Workshop (HTML)

May/June 2006 (vol. 23 no. 3)

pp. 185

	ASCII Text	x
	Fabian Vargas, "2006 Latin American Test Workshop," IEEE Design and Test of Computers, vol. 23, no. 3, pp. 185, May/June, 2006.

	BibTex	x
	@article{ 10.1109/MDT.2006.58, author = {Fabian Vargas}, title = {2006 Latin American Test Workshop}, journal ={IEEE Design and Test of Computers}, volume = {23}, number = {3}, issn = {0740-7475}, year = {2006}, pages = {185}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.58}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - 2006 Latin American Test Workshop IS - 3 SN - 0740-7475 SP EP EPD - 185 A1 - Fabian Vargas, PY - 2006 KW - Latin American Test Workshop VL - 23 JA - IEEE Design and Test of Computers ER -

Fabian Vargas, General Chair, LATW '06

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.58

The author presents highlights from the 7th Annual IEEE Latin American Test Workshop (LATW '06), held in the capital city of Buenos Aires, Argentina, 26-29 March.

Index Terms:

Latin American Test Workshop

Citation:

Fabian Vargas, "2006 Latin American Test Workshop," IEEE Design and Test of Computers, vol. 23, no. 3, pp. 185, May/June 2006, doi:10.1109/MDT.2006.58

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