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March/April 2006 (vol. 23 no. 2)
pp. 167
ASCII Text
x 
 
Sandip Kundu, "TTTC technical forum honoring Sudhakar M. Reddy," IEEE Design and Test of Computers, vol. 23, no. 2, pp. 167, March/April, 2006.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2006.55,
author = {Sandip Kundu},
title = {TTTC technical forum honoring Sudhakar M. Reddy},
journal ={IEEE Design and Test of Computers},
volume = {23},
number = {2},
issn = {0740-7475},
year = {2006},
pages = {167},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.55},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - TTTC technical forum honoring Sudhakar M. Reddy
IS - 2
SN - 0740-7475
SP
EP
EPD - 167
A1 - Sandip Kundu,
PY - 2006
KW - Sudhakar M. Reddy
KW - TTTC
KW - ITC 2005
KW - Moore's law
VL - 23
JA - IEEE Design and Test of Computers
ER -
 
Sandip Kundu, University of Massachusetts
In conjunction with the 2005 International Test Conference, the Test Technology Technical Council sponsored a forum honoring Sudhakar M. Reddy.
Index Terms:
Sudhakar M. Reddy, TTTC, ITC 2005, Moore's law
Citation:
Sandip Kundu, "TTTC technical forum honoring Sudhakar M. Reddy," IEEE Design and Test of Computers, vol. 23, no. 2, pp. 167, Mar./Apr. 2006, doi:10.1109/MDT.2006.55
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