The Impact of Multiple Failure Modes on Estimating Product Field Reliability

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March/April 2006 (vol. 23 no. 2)

pp. 118-126

	ASCII Text	x
	John M. Carulli Jr., Thomas J. Anderson, "The Impact of Multiple Failure Modes on Estimating Product Field Reliability," IEEE Design and Test of Computers, vol. 23, no. 2, pp. 118-126, March/April, 2006.

	BibTex	x
	@article{ 10.1109/MDT.2006.53, author = {John M. Carulli Jr. and Thomas J. Anderson}, title = {The Impact of Multiple Failure Modes on Estimating Product Field Reliability}, journal ={IEEE Design and Test of Computers}, volume = {23}, number = {2}, issn = {0740-7475}, year = {2006}, pages = {118-126}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.53}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - The Impact of Multiple Failure Modes on Estimating Product Field Reliability IS - 2 SN - 0740-7475 SP118 EP126 EPD - 118-126 A1 - John M. Carulli Jr., A1 - Thomas J. Anderson, PY - 2006 KW - reliability KW - burn-in KW - early failure rate KW - DPPM VL - 23 JA - IEEE Design and Test of Computers ER -

John M. Carulli Jr., Texas Instruments

Thomas J. Anderson, Texas Instruments

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.53

Editor's note: A difficulty in reliability modeling is how to capture all of the various reliability defect types. This is a particularly difficult challenge because defect data varies based on fab, technology maturity, and product details. This article describes the framework and models for representing a multitude of reliability defects. --Phil Nigh, IBM Microelectronics

Index Terms:

reliability, burn-in, early failure rate, DPPM

Citation:

John M. Carulli Jr., Thomas J. Anderson, "The Impact of Multiple Failure Modes on Estimating Product Field Reliability," IEEE Design and Test of Computers, vol. 23, no. 2, pp. 118-126, Mar./Apr. 2006, doi:10.1109/MDT.2006.53

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