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Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis
March/April 2006 (vol. 23 no. 2)
pp. 88-98
ASCII Text
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Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge Demidenko, "Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis," IEEE Design and Test of Computers, vol. 23, no. 2, pp. 88-98, March/April, 2006.
 
 
BibTex
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@article{ 10.1109/MDT.2006.50,
author = {Mohd Fairuz Zakaria and Zainal Abu Kassim and Melanie Po-Leen Ooi and Serge Demidenko},
title = {Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis},
journal ={IEEE Design and Test of Computers},
volume = {23},
number = {2},
issn = {0740-7475},
year = {2006},
pages = {88-98},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.50},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis
IS - 2
SN - 0740-7475
SP88
EP98
EPD - 88-98
A1 - Mohd Fairuz Zakaria,
A1 - Zainal Abu Kassim,
A1 - Melanie Po-Leen Ooi,
A1 - Serge Demidenko,
PY - 2006
KW - integral circuit testing
KW - burn-in reduction
KW - voltage stress
KW - Weibull analysis
VL - 23
JA - IEEE Design and Test of Computers
ER -
 
Mohd Fairuz Zakaria, Freescale Semiconductor, Malaysia
Zainal Abu Kassim, Freescale Semiconductor, Malaysia
Melanie Po-Leen Ooi, Monash University Malaysia
Serge Demidenko, Monash University Malaysia
Editor's note: High-voltage stress testing (HVST) is common in IC manufacturing, but publications comparing it with other test and burn-in methods are scarce. This article shows that the use of HVST can dramatically reduce the amount of required burn-in. --Phil Nigh, IBM Microelectronics
Index Terms:
integral circuit testing, burn-in reduction, voltage stress, Weibull analysis
Citation:
Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge Demidenko, "Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis," IEEE Design and Test of Computers, vol. 23, no. 2, pp. 88-98, Mar./Apr. 2006, doi:10.1109/MDT.2006.50
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