Dealing with Early Life Failures

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March/April 2006 (vol. 23 no. 2)

pp. 85

	ASCII Text	x
	Kwang-Ting (Tim) Cheng, "Dealing with Early Life Failures," IEEE Design and Test of Computers, vol. 23, no. 2, pp. 85, March/April, 2006.

	BibTex	x
	@article{ 10.1109/MDT.2006.39, author = {Kwang-Ting (Tim) Cheng}, title = {Dealing with Early Life Failures}, journal ={IEEE Design and Test of Computers}, volume = {23}, number = {2}, issn = {0740-7475}, year = {2006}, pages = {85}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.39}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Dealing with Early Life Failures IS - 2 SN - 0740-7475 SP EP EPD - 85 A1 - Kwang-Ting (Tim) Cheng, PY - 2006 KW - latent defects KW - burn-in KW - IDDQ KW - technology scaling KW - embedded systems VL - 23 JA - IEEE Design and Test of Computers ER -

Kwang-Ting (Tim) Cheng, University of California, Santa Barbara

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.39

D&T editor in chief Tim Cheng discusses the industry's struggle to screen latent defects for complex ICs. He also welcomes two new editors to the D&T editorial board.

Index Terms:

latent defects, burn-in, IDDQ, technology scaling, embedded systems

Citation:

Kwang-Ting (Tim) Cheng, "Dealing with Early Life Failures," IEEE Design and Test of Computers, vol. 23, no. 2, pp. 85, Mar./Apr. 2006, doi:10.1109/MDT.2006.39

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