Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction

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	Similar Articles Articles by Thomas S. Barnett Articles by Matt Grady Articles by Kathleen G. Purdy Articles by Adit D. Singh

March/April 2006 (vol. 23 no. 2)

pp. 110-116

	ASCII Text	x
	Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh, "Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction," IEEE Design and Test of Computers, vol. 23, no. 2, pp. 110-116, March/April, 2006.

	BibTex	x
	@article{ 10.1109/MDT.2006.38, author = {Thomas S. Barnett and Matt Grady and Kathleen G. Purdy and Adit D. Singh}, title = {Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction}, journal ={IEEE Design and Test of Computers}, volume = {23}, number = {2}, issn = {0740-7475}, year = {2006}, pages = {110-116}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.38}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction IS - 2 SN - 0740-7475 SP110 EP116 EPD - 110-116 A1 - Thomas S. Barnett, A1 - Matt Grady, A1 - Kathleen G. Purdy, A1 - Adit D. Singh, PY - 2006 KW - reliability KW - testing KW - fault tolerance VL - 23 JA - IEEE Design and Test of Computers ER -

Thomas S. Barnett, IBM Systems and Technology Group

Matt Grady, IBM Systems and Technology Group

Kathleen G. Purdy, IBM Systems and Technology Group

Adit D. Singh, Auburn University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.38

Editor's note: It is important to understand the correlation between defects causing yield loss and defects causing reliability failures. This article presents a modeling methodology and supporting data, demonstrating that yield and reliability defects can be directly linked in a unified model. ?Phil Nigh, IBM Microelectronics

Index Terms:

reliability, testing, fault tolerance

Citation:

Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh, "Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction," IEEE Design and Test of Computers, vol. 23, no. 2, pp. 110-116, Mar./Apr. 2006, doi:10.1109/MDT.2006.38

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