Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers

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	Similar Articles Articles by Ritesh P. Turakhia Articles by W. Robert Daasch Articles by Joel Lurkins Articles by Brady Benware

March/April 2006 (vol. 23 no. 2)

pp. 100-109

	ASCII Text	x
	Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware, "Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers," IEEE Design and Test of Computers, vol. 23, no. 2, pp. 100-109, March/April, 2006.

	BibTex	x
	@article{ 10.1109/MDT.2006.37, author = {Ritesh P. Turakhia and W. Robert Daasch and Joel Lurkins and Brady Benware}, title = {Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers}, journal ={IEEE Design and Test of Computers}, volume = {23}, number = {2}, issn = {0740-7475}, year = {2006}, pages = {100-109}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.37}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers IS - 2 SN - 0740-7475 SP100 EP109 EPD - 100-109 A1 - Ritesh P. Turakhia, A1 - W. Robert Daasch, A1 - Joel Lurkins, A1 - Brady Benware, PY - 2006 KW - reliability KW - statistical outlier screening KW - data modeling KW - adaptive testing VL - 23 JA - IEEE Design and Test of Computers ER -

Ritesh P. Turakhia, Portland State University

W. Robert Daasch, Portland State University

Joel Lurkins, LSI Logic

Brady Benware, LSI Logic

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.37

Editor's note: An emerging opportunity is to use statistical analysis of parametric measurements to improve the effectiveness and efficiency of testing and reliability defect stressing. In this article, the authors propose a "statistical testing" framework that combines testing, analysis, and optimization to identify latent-defect signatures --Phil Nigh, IBM Microelectronics

Index Terms:

reliability, statistical outlier screening, data modeling, adaptive testing

Citation:

Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware, "Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers," IEEE Design and Test of Computers, vol. 23, no. 2, pp. 100-109, Mar./Apr. 2006, doi:10.1109/MDT.2006.37

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