MOSFET Mismatch Modeling: A New Approach

Design&Test
2006
Issue No. 1 - January/February
Abstract - MOSFET Mismatch Modeling: A New Approach

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January/February 2006 (vol. 23 no. 1)

pp. 20-29

	ASCII Text	x
	Hamilton Klimach, Carlos Galup-Montoro, M?rcio C. Schneider, Alfredo Arnaud, "MOSFET Mismatch Modeling: A New Approach," IEEE Design and Test of Computers, vol. 23, no. 1, pp. 20-29, January/February, 2006.

	BibTex	x
	@article{ 10.1109/MDT.2006.20, author = {Hamilton Klimach and Carlos Galup-Montoro and M?rcio C. Schneider and Alfredo Arnaud}, title = {MOSFET Mismatch Modeling: A New Approach}, journal ={IEEE Design and Test of Computers}, volume = {23}, number = {1}, issn = {0740-7475}, year = {2006}, pages = {20-29}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.20}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - MOSFET Mismatch Modeling: A New Approach IS - 1 SN - 0740-7475 SP20 EP29 EPD - 20-29 A1 - Hamilton Klimach, A1 - Carlos Galup-Montoro, A1 - M?rcio C. Schneider, A1 - Alfredo Arnaud, PY - 2006 KW - MOSFET KW - matching KW - integrated circuit design KW - simulation KW - mismatch compact model VL - 23 JA - IEEE Design and Test of Computers ER -

Hamilton Klimach, Federal University of Rio Grande do Sul

Carlos Galup-Montoro, Federal University of Santa Catarina

M?rcio C. Schneider, Federal University of Santa Catarina

Alfredo Arnaud, Catholic University of Uruguay

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.20

Editor's note: Handling component mismatch represents a great challenge in analog and even digital design for current and future submicron technologies. This article, a special selection from the Symposium on Integrated Circuits and Systems Design (SBCCI), presents a matching model to help designers account for real effects while maintaining simplicity and easing the design effort.

--Luigi Carro, Federal University of Rio Grande do Sul

Index Terms:

MOSFET, matching, integrated circuit design, simulation, mismatch compact model

Citation:

Hamilton Klimach, Carlos Galup-Montoro, M?rcio C. Schneider, Alfredo Arnaud, "MOSFET Mismatch Modeling: A New Approach," IEEE Design and Test of Computers, vol. 23, no. 1, pp. 20-29, Jan./Feb. 2006, doi:10.1109/MDT.2006.20

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