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November/December 2006 (vol. 23 no. 6)
pp. 434
ASCII Text
x 
 
Tim Cheng, "Handling variations and uncertainties," IEEE Design and Test of Computers, vol. 23, no. 6, pp. 434, November/December, 2006.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2006.148,
author = {Tim Cheng},
title = {Handling variations and uncertainties},
journal ={IEEE Design and Test of Computers},
volume = {23},
number = {6},
issn = {0740-7475},
year = {2006},
pages = {434},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.148},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Handling variations and uncertainties
IS - 6
SN - 0740-7475
SP
EP
EPD - 434
A1 - Tim Cheng,
PY - 2006
KW - statistical design
KW - test process
KW - variation
KW - reliability
VL - 23
JA - IEEE Design and Test of Computers
ER -
 
With increased technology scaling, high variability and low reliability will likely be the main challenges for chip design and testing. This issue discusses some of the key issues for handling increasing variations and uncertainties. Also, D&T's plans for 2007 special themes have been finalized.
Index Terms:
statistical design, test process, variation, reliability
Citation:
Tim Cheng, "Handling variations and uncertainties," IEEE Design and Test of Computers, vol. 23, no. 6, pp. 434, Nov./Dec. 2006, doi:10.1109/MDT.2006.148
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